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ArticlePeer ReviewedOpen AccessPlagiarism Passed
Paper ID:10.55041/IJSREM55967

AI Powered Hyper Spectral Seed Analysis Device

Stream/Area:

-

Subject:

-

Paper ID:

10.55041/IJSREM55967

Volume:

10 |

1 |

Jan 2026

Pages:

Publication Frequency:

Monthly (12 issues per year)

DOI
Digital Object Identifier
10.55041/IJSREM55967

License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.

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Authors

MB

Manoj Bhandari1

DMSH

Dr. Malatesh S H2

MB

Milan Bhandari3

MI

MOHD Irfan4

NS

Niranjan Sah5

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Abstract

In modern agriculture, ensuring high seed quality is essential for maximizing crop yield, maintaining food security, and reducing post-harvest losses. Traditional seed quality assessment methods are largely manual, time- consuming, and prone to human error. This project presents the design and development of an AI Powered Hyperspectral Seed Analysis Device that enables automated, real-time classification and grading of seeds using computer vision, deep learning, and gas-sensing technologies. The system integrates a camera-based imaging module with MQ-3 and MQ-6 gas sensors connected to a microcontroller. Seed images are processed using a YOLO-based deep learning model to detect defects and classify seeds into quality grades, while the gas sensors monitor chemical emissions to identify spoilage or contamination. The combined visual and environmental analysis provides a non- destructive, scalable, and accurate method for seed quality evaluation. The proposed solution is cost-effective, portable, and suitable for applications in agriculture, seed production, and quality certification industries.

KEYWORDS

Hyperspectral Imaging Seed Quality Analysis Deep Learning YOLO Gas Sensors MQ-3 MQ-6 Arduino Agriculture Automation Computer Vision.

Cite This Article

Manoj Bhandari1, Dr. Malatesh S H2, Milan Bhandari3, MOHD Irfan4, Niranjan Sah5, "AI Powered Hyper Spectral Seed Analysis Device," International Journal of Scientific Research in Engineering and Management, vol. 10, no. 1, Jan 2026. https://doi.org/10.55041/IJSREM55967

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Publication Date

9/30/2026

Peer Review Type

Double-Blind Peer Review

Review Rounds: 2

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0

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5

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This manuscript has been checked for plagiarism using TurnitinPlagiarismChecker software.

Conflict of Interest

The authors declare no conflict of interest related to this research work.

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No funding information available for this research.

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