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Stream/Area:
-
Subject:
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Paper ID:
IJSREM62340
Volume:
10 |
5 |
May 2026
Pages:
1-12
Publication Frequency:
Monthly (12 issues per year)
License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.

Department of Computer Science
Bangalore University, Haute Ecole de Commerce Kinshasa
Software defect detection is a critical challenge in modern software engineering, directly impacting the reliability, security, and performance of software systems. Traditional manual code review and static analysis techniques are often insufficient to handle the complexity and scale of contemporary software projects. Machine learning (ML) has emerged as a transformative paradigm, enabling automated, data-driven approaches to defect prediction and detection. This paper presents a comprehensive survey of ML-based software defect detection techniques, examining classical methods such as Naive Bayes, Support Vector Machines, and Decision Trees, as well as advanced deep learning architectures including Convolutional Neural Networks, Long Short-Term Memory networks, and Graph Neural Networks. We analyze feature extraction strategies ranging from traditional code metrics to abstract syntax tree representations and graph-based code embeddings. A thorough evaluation of benchmark datasets, performance metrics, and comparative studies is provided, alongside a discussion of current limitations and promising future research directions. Experimental results from our analysis indicate that deep learning models consistently outperform classical approaches, with Graph Neural Networks achieving the highest defect detection accuracy on standard benchmarks.
KEYWORDS
This paper has presented a comprehensive survey of machine learning approaches to automatic software defect detection, spanning the full spectrum from early statistical methods to state-of-the-art deep learning architectures. Our analysis has traced the evolution of the field from simple metric-based classifiers to sophisticated graph neural networks and pre-trained transformer models capable of learning rich, multi-scale representations of program structure and semantics. The empirical evidence consistently demonstrates that deep learning approaches, and particularly graph-based and transformer-based models, achieve superior defect detection performance compared to classical ML methods. The pre-train/fine-tune paradigm has emerged as a particularly effective strategy, enabling high-accuracy detection with limited labeled training data by leveraging knowledge acquired from large unlabeled code corpora. Feature representation remains a crucial determinant of model performance, with graph-based representations encoding program structure and data flow outperforming simpler metric and token-based approaches. Despite these impressive advances, significant challenges remain before ML-based defect detection can be fully integrated into mainstream software development practice. Cross-project generalization, model interpretability, data quality, and adaptability to evolving codebases are pressing open problems that require sustained research attention. The emergence of large language models introduces both new opportunities and new challenges, particularly around reliability and uncertainty quantification. The long-term vision of this research agenda is the development of AI-assisted software development environments that seamlessly and continuously monitor code quality, flag potential defects at the point of authorship, and provide actionable repair suggestions grounded in natural language explanations. Realizing this vision will require advances not only in ML modeling but also in software engineering methodology, human-computer interaction, and empirical evaluation practice. We hope that this survey serves as a valuable reference for researchers and practitioners working toward this important goal.
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Publication Date
5/3/2026
Peer Review Type
Double-Blind Peer Review
Review Rounds: 2
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