Loading article...
Loading article...
Stream/Area:
-
Subject:
-
Paper ID:
IJSREM68629
Volume:
10 |
10 |
Oct 2026
Pages:
1-15
Publication Frequency:
Monthly (12 issues per year)
License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.
First Year Engineering
Thakur Shree DPS College of Enghineering & Management
One of the most adaptable nanofabrication techniques for creating ultra-high-resolution structures needed in advanced microelectronics, quantum computing, integrated photonics, biosensing, and biomedical engineering is still electron beam lithography (EBL). Low throughput, proximity effects, beam instability, process variability, high computational intricacy, and substantial use of energy are specific enduring hindrances to the mainstream manufacturing deployment of EBL, despite its remarkable patterning competency. Nevertheless, the rendition of contemporary AI-motivated EBL exploration into consistent, scalable fabrication settings is constrained since it is still dispersed and predominantly application-specific. Indispensable obstacles to AI-enabled EBL are highlighted in this paper, including data constraints, inadequate model generalization, a lack of intelligent control in real time, physics-informed and explainable AI integration, and the sustainability considerations. The review suggests a multifaceted framework that combines explainable and transferable machine learning, digital twins, adaptive process optimization, intelligent feedback control, physics-based modelling, and sustainability-driven performance metrics in line with the Sustainable Development Goals (SDGs) of the UN to address these issues. By linking scientific, computational, ecological and social facets, this hypothesis extends a line for switching EBL into a mountable, viable and smart nanomanufacturing platform.
KEYWORDS
While artificial intelligence has the potential to significantly improve optimization, precision, and process control in electron beam lithography (EBL), its practical application is still at an early stage of development. Many challenges remain before AI-driven approaches can be fully integrated into industrial lithography systems. Addressing these challenges requires collaborative and multidisciplinary research that brings together expertise from several fields, including lithography physics, control theory, machine learning, and system engineering. A deeper understanding of beam material interactions and process dynamics is necessary to develop reliable AI models, while advanced control strategies are required to maintain stability and accuracy during operation. At the same time, machine learning algorithms must be designed to be robust, adaptable, and capable of handling large and complex datasets generated during lithography processes. Effective integration of these technologies with existing fabrication systems is also essential to ensure real-time decision-making and process optimization. By combining these diverse areas of knowledge and technological development, researchers can move closer to creating dependable, scalable, and real-time AI-assisted EBL systems that are suitable for practical industrial manufacturing. In conclusion, the proposed multidimensional framework advances AI-enabled Electron Beam Lithography by addressing key research gaps while promoting sustainable nanofabrication. Through AI-driven process optimization and predictive maintenance, the framework has the potential to reduce energy consumption, material waste, and carbon emissions associated with semiconductor manufacturing. These outcomes support SDG 9 (Industry, Innovation and Infrastructure) by fostering sustainable industrial innovation, SDG 12 (Responsible Consumption and Production) through efficient resource utilization and waste reduction, and SDG 13 (Climate Action) by encouraging energy-efficient, low-carbon manufacturing practices. Future validation using sustainability metrics, such as life cycle assessment and carbon footprint analysis, will further demonstrate the framework's contribution to environmentally responsible semiconductor manufacturing.
[1] Cui, Z. (2024). Electron beam lithography. In Nanofabrication (pp. 83–139). Springer. [2] Yang, Y., Liu, K., Gao, Y., et al. (2025). Advancements and challenges in artificial intelligence-based lithography techniques. Light: Science & Applications, 14, 250. [3] Hudek, P., & Beyer, D. (2006). Exposure optimization in high-resolution e-beam lithography. Microelectronic Engineering, 83(4–9), 780–783. https://doi.org/10.1016/j.mee.2006.01.184 [4] Zhao, R., Wang, X., Xu, H., Wei, Y., & He, X. (2024). Machine learning-assisted optimization of photoresist processes for high-resolution electron beam lithography. Nanoscale, 16, 4212–4218. [5] Chen, W.-J. (2015). Nanofabrication by electron beam lithography and its applications: A review. Microelectronic Engineering, 135, 57–72. [6] Vieu, C., Carcenac, F., Pépin, A., Chen, Y., Mejias, M., Lebib, A., Manin-Ferlazzo, L., Couraud, L., & Launois, H. (2000). Electron beam lithography: Resolution limits and applications. Applied Surface Science, 164(1–4), 111–117. [7] Madou, M. J. (2012). Fundamentals of microfabrication and nanotechnology (3rd ed.). CRC Press. [8] Altissimo, M. (2010). E-beam lithography for micro-/nanofabrication. Biomicrofluidics, 4(2), Article 026503. https://doi.org/10.1063/1.3437589 [9] Frye, R. C., Cummings, K. D., & Rietman, E. A. (1990). Proximity effect corrections in electron beam lithography using a neural network. Advances in Neural Information Processing Systems, 3, 443–449. [10] Shimoaoki, T., Hirata, K., Yoshida, K., & Horiuchi, T. (1995). Neural networks application for fast, direct correction kernel generation for proximity effects correction in electron beam lithography. Microelectronic Engineering, 27(1–4), 191–194. https://doi.org/10.1016/0167-9317(94)00087-B
Publication Date
10/31/2026
Peer Review Type
Double-Blind Peer Review
Review Rounds: 2
Documents
Article Views
0
Total views since publication
PDF Downloads
3
Total downloads since publication
Geographic Reach
5
Digital Preservation: This article is permanently archived on Zenodo and complies with all data preservation standards across major indexing platforms.
Plagiarism Screening
This manuscript has been checked for plagiarism using TurnitinPlagiarismChecker software.
Conflict of Interest
The authors declare no conflict of interest related to this research work.
Funding Information
No funding information available for this research.
Related research in the same subject area
Loading similar articles...