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Stream/Area:
-
Subject:
-
Paper ID:
IJSREMWP8080
Volume:
8 |
5 |
May 2024
Pages:
Publication Frequency:
Monthly (12 issues per year)
License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.
Machine vision technology is one of the main areas of rapid development in the modern world and is becoming increasingly important in various industries. This innovative technology uses the fusion of computer vision and artificial intelligence to process and analyze visual information, enabling the development of automated inspection systems and the automation of processes. In particular, machine vision technology is playing an increasingly important role in OLED film production and quality control. Currently, OLED film production is mainly based on visual inspection, but this method has various problems. It is labor-intensive and relies on humans, which limits the accuracy and consistency of the inspection. It is also difficult to identify defective elements with irregular shapes or sizes. To overcome these issues and revolutionize the field of OLED film production and quality control, we propose an OLED Film Inspection Architecture with Machine vision. This architecture utilizes advanced cameras and sensors to analyze the surface of OLED films in detail and automatically identify defective elements. In addition, by integrating multiple optical systems and AI deep learning algorithms, it can perform accurate inspections under various lighting conditions and detect defects in real time. By utilizing these advanced technologies, quality control and production efficiency can be greatly improved, which is expected to drive innovation in OLED film production. This research provides a high level of technical content and provides a bright outlook for the future of machine vision technology in the industrial field.
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Publication Date
10/4/2024
Peer Review Type
Double-Blind Peer Review
Review Rounds: 2
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Conflict of Interest
The authors declare no conflict of interest related to this research work.
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