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Stream/Area:
-
Subject:
-
Paper ID:
IJSREM44123
Volume:
9 |
4 |
Apr 2025
Pages:
Publication Frequency:
Monthly (12 issues per year)
License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.
â The defects of printed circuit boards (PCBs) generated during the manufacturing process have an adverse effect on product quality, which further directly affects the stability and reliability of equipment performance. However, there are still great challenges in accurately recognizing tiny defects on the surface of PCB under the complex background due to its compact layout. To address the problem, a novel YOLO Hornet-MCBAM-CARAFE (YOLO-HMC) network based on improved YOLOv5 framework is proposed in this article to identify the tiny-size PCB defect more accurately and efficiently with fewer model parameters.
KEYWORDS
Publication Date
4/10/2025
Peer Review Type
Double-Blind Peer Review
Review Rounds: 2
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Conflict of Interest
The authors declare no conflict of interest related to this research work.
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