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Stream/Area:
-
Subject:
-
Paper ID:
IJSREM60568
Volume:
10 |
4 |
April 2026
Pages:
Publication Frequency:
Monthly (12 issues per year)
License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.
This study proposes an efficient method for early detection of fungal diseases in wheat crops using image processing and machine learning. The system classifies wheat leaves into two categories: Black rust (stem rust) and Healthy. Images are first pre-processed through resizing to ensure uniformity, followed by feature extraction using Histogram of Oriented Gradients (HOG) to capture texture and shape characteristics. A Support Vector Machine (SVM) classifier is trained on labelled data to perform classification. Model performance is evaluated using confusion matrix–based metrics, including accuracy, precision, recall, and F1-score. Results indicate that the SVM model achieves high classification accuracy, demonstrating its effectiveness as a decision-support tool for early disease detection, enabling timely intervention and improved crop productivity.
KEYWORDS
Publication Date
4/19/2026
Peer Review Type
Double-Blind Peer Review
Review Rounds: 2
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Conflict of Interest
The authors declare no conflict of interest related to this research work.
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