Crossref DOIMemberCiteFactoropen accessissn
SJIF Impact Factor 8.659 | ISSN: 2582-3930
IJSREM Logo

International Journal of Scientific Research in Engineering and Management

(Gateway to Global Scholars - An International, Scholarly, Multi-Disciplinary, Open Access Journal)

Peer-Reviewed Journal Designed to Meet UGC's Quality Parameters

HomeCurrent IssuePast IssuesPay OnlineConferencesEditorial BoardAbout UsContact Us
IJSREM

Loading article...

Follow Us

  • Google Scholar
  • ResearchGate
  • Academia.edu
  • Mendeley
  • LinkedIn
  • Facebook
  • Instagram

Journal Policies

  • Peer Review Policy
  • Publication Ethics
  • Copyright Infringement
  • Refund & Cancellation Policy
  • Terms and Conditions
  • Privacy Policy

Journal Identifiers & Licenses

  • ISSN Verified: 2582-3930ISSN Verified: 2582-3930
  • Crossref DOI: 10.55041Crossref DOI: 10.55041
  • SJIF Ranking: 08.659SJIF Ranking: 08.659
  • Licensed under CC BY 4.0Licensed under CC BY 4.0
  • ISO Certification: 9001:2015ISO Certification: 9001:2015
  • Indexed & Cited In: Google ScholarIndexed & Cited In: Google Scholar

Contact Us

International Journal of Scientific Research in Engineering and Management (IJSREM)

#62/1, New No 7, 1st Cross, 2nd Main, Ganganagar, R T Nagar, Bangalore North, Bangalore, Karnataka, India – 560032
[email protected]+91 93911 67991
logos
logos
Working Hours

Mon – Sat: 9:00 AM – 6:00 PM

Sunday: 10:00 AM – 4:00 PM

+91 93911 67991

© 2026 IJSREM – International Journal of Scientific Research in Engineering and Management. This is an open-access journal. Articles are published under the Creative Commons Attribution (CC BY 4.0) License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

DisclaimerPrivacy PolicyTerms and Conditions
ArticlePeer ReviewedOpen AccessPlagiarism Passed
Paper ID:IJSREM62718

InvenSight: AI-Powered Warehouse Damage Detection System Using ResNet-Based Classification

Stream/Area:

-

Subject:

-

Paper ID:

IJSREM62718

Volume:

10 |

5 |

May 2026

Pages:

1-9

Publication Frequency:

Monthly (12 issues per year)

DOI
Digital Object Identifier
10.55041/IJSREM62718

License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.

Share this article:

Authors

NE

Nithya Etoori

Department of Computer Science

Keshav Memorial Institute of Technology

Download Author Certificate
RG

Rishika Gudla

Department of Computer Science

Keshav Memorial Institute of Technology

Download Co-Author Certificate
VP

Vaidika Padigela

Department of Computer Science

Keshav Memorial Institute of Technology

Download Co-Author Certificate
KCL

Kolakanti Chetan Laxminath

Department of Computer Science

Keshav Memorial Institute of Technology

Download Co-Author Certificate

Mentors

PS

Priyanka Saxena

Department of Computer Science

Keshav Memorial Institute of Technology

Download Mentor Certificate

Author Services & Downloads

Full ArticlesAcceptance Certificate

Abstract

In contemporary retail supply chains, the prompt identification of damaged or defective goods within warehouse operations is critical to maintaining product quality, operational efficiency, and customer satisfaction. Traditional inspection processes rely heavily on manual visual checks, which are inherently slow, error-prone, fatigue-sensitive, and non-scalable. To address these challenges, this project presents InvenSight, an AI-powered computer vision system designed for real-time damage detection of packaged goods during warehouse operations. InvenSight integrates a ResNet-34-based deep-learning image classifier, live video stream processing, a Flask backend orchestration layer, MongoDB persistence, and a React.js staff dashboard to deliver end-to-end damage traceability. A fine-tuned ResNet-34 model trained on an expanded dataset of 6,000 labeled samples achieved an overall accuracy of 93.3%, with balanced precision and recall. The system integrates seamlessly into logistics pipelines for automated, real-time inspection and substantially reduced operational errors.

KEYWORDS

Keywords: Computer vision deep learning e-commerce InvenSight logistics automation package inspection ResNet-34 transfer learning warehouse automation.

Cite This Article

Nithya Etoori, Rishika Gudla, Vaidika Padigela, Kolakanti Chetan Laxminath, Priyanka Saxena, "InvenSight: AI-Powered Warehouse Damage Detection System Using ResNet-Based Classification," International Journal of Scientific Research in Engineering and Management, vol. 10, no. 5, pp. 1-9, May 2026. https://doi.org/10.55041/IJSREM62718

Full Article/Conclusion

This study investigated the impact of five different optimizers—Adam, SGD with momentum, RMSProp, NAdam, and Adamax—on the convergence behavior and generalization of a ResNet-50-based vision inspection framework. Experimental results demonstrated that Adam consistently achieved the fastest convergence and highest validation accuracy (87.10%), while RMSProp and SGD with momentum also showed competitive performance. Fine-tuning the last 20 layers of ResNet-50 using the optimal optimizer further enhanced domain-specific feature adaptation, improving validation accuracy by approximately 2–3%. The resulting InvenSight system successfully transforms damage inspection from a human-bottlenecked, inconsistent, non-auditable process into an AI-first, human-verified, fully-logged, analytics-friendly workflow that scales with warehouse throughput rather than with headcount. The system is ready for real-world pilot deployment, and its modular architecture leaves ample room for enhancements including multi-class damage taxonomy, YOLO-based localization, conveyor diversion integration, and WMS plug-in adapters. Smarter Damage Control, Stronger Supply Chain.  

References

[1] V. Kumar and M. Kumari, "Barcode recognition using CNN for logistics automation," Int. J. Comput. Appl., 2018. [2] S. Lee and J. Yoon, "Automated parcel classification using convolutional networks," IEEE Access, 2019. [3] Y. Zhang and X. Li, "Surface defect detection in manufacturing using deep learning," IEEE Trans. Ind. Informatics, 2020. [4] K. He, X. Zhang, S. Ren, and J. Sun, "Deep residual learning for image recognition," in Proc. IEEE Conf. Comput. Vis. Pattern Recognit., 2016. [5] J. Deng et al., "ImageNet: A large-scale hierarchical image database," in Proc. IEEE Conf. Comput. Vis. Pattern Recognit., 2009. [6] J. Vater, M. Kirschning, and A. Knoll, "Real-time error detection in production using edge computing," in Proc. Int. Conf. Omni-Layer Intell. Syst., 2020. [7] G. Litjens et al., "Deep learning in medical image analysis," Medical Image Analysis, vol. 42, pp. 60–88, 2017. [8] J. Liu et al., "Steel-surface defect classification with deep residual learning," Computers in Industry, 2021. [9] Q. Li and Y. Huang, "Defect detection in semiconductor wafers using CNN," Sensors, 2020. [10] A. Saeed et al., "Multi-sensor data augmentation for robust sensing," in Proc. Int. Conf. Omni-Layer Intell. Syst., 2020.

Editorial & Review Transparency

Publication Date

5/6/2026

Peer Review Type

Double-Blind Peer Review

Review Rounds: 2

Documents

Review Report (Confidential)
Copyright Form (Office)

Article Metrics & Impact

Article Views

1

Total views since publication

PDF Downloads

7

Total downloads since publication

Geographic Reach

5

Indexing, Archiving & Preservation

Google Scholar
Academia
ResearchGate
Crossref
SSRN
Semantic Scholar
Thomson Reuters
WorldCat
Mendeley
OpenAlex
EBSCO
Zenodo

Digital Preservation: This article is permanently archived on Zenodo and complies with all data preservation standards across major indexing platforms.

Ethics, Compliance & Transparency

Plagiarism Screening

This manuscript has been checked for plagiarism using TurnitinPlagiarismChecker software.

Conflict of Interest

The authors declare no conflict of interest related to this research work.

Funding Information

No funding information available for this research.

Similar & Recommended Articles

Similar Articles by Topic

Related research in the same subject area

Loading similar articles...