Investigation of Shear Lags Effect for EMI and PZT Technique by using Analytical Approach

The birth of smart devices such as piezoelectric (PZT) transducers has helped to transform the structural health monitoring system (SHM) based on non-destructive testing methods (NDT). Currently, the effect of adhesion layer adhesion (Shear lag effect) is considered to be negligible in the actual application of the EMI process. Although the new NDT method known as electromechanical (EMI) technique has been investigated for more than two decades, there are still a variety of problems that need to be resolved before it can be applied to real buildings. The strategy, which has great potential to contribute to the development of one of the most efficient SHM systems, involves the use of a single PZT to entertain and experience the host structure. In this paper, studies that have applied over the past decade related to the EMI approach have been reviewed to understand its trends. In addition, new ideas and ideas proposed by various authors are also explored, and the paper concludes with a discussion of possible guidelines for future activities.