Microstructural Analysis of Stabilized Rammed Earth Using XRD And SEM Methods
1Saiqual Fraz, 2Sameeksha Kothari, 3Shivsagar Patil, 4Tushar Borar, 5Shrithi S Badami
1,2,3,4 UG Students, RV College of Engineering, Bangalore
5Assistant Professor, RV College of Engineering, Bangalore
Abstract
The microstructure analysis of stabilized rammed earth (SRE) is crucial for understanding its mechanical properties, durability, and long-term performance. This literature review paper investigates the application of X-ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) in analyzing the microstructural characteristics of SRE. XRD is employed to identify the crystalline phases present in the material, providing insights into the mineralogical composition and the effects of stabilization agents. SEM offers high-resolution images that reveal the surface morphology, particle distribution, and bonding mechanisms within the stabilized matrix. By synthesizing recent studies, this review highlights the advancements in microstructural analysis techniques and their implications for the optimization of SRE in construction.
The findings from XRD and SEM analyses are integrated to present a comprehensive understanding of the microstructure-property relationships in SRE. The literature suggests that stabilization methods, such as the addition of cement, lime, or other additives, significantly influence the crystallinity, particle interlocking, and pore structure of the rammed earth. This review discusses the correlation between microstructural features observed through XRD and SEM and the resulting mechanical properties, such as compressive strength and durability. The paper concludes by identifying gaps in the current research and proposing directions for future studies, emphasizing the need for standardized testing protocols and the exploration of novel stabilization materials to enhance the performance of SRE.
Keywords: X-Ray Diffraction, Scanning Electron Microscopy, Energy Dispersive X-Ray Analysis
