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ArticlePeer ReviewedOpen AccessPlagiarism Passed
Paper ID:10.55041/IJSREM16214

PARAMETER ANALYSIS OF SRAM CIRCUIT

Stream/Area:

-

Subject:

-

Paper ID:

10.55041/IJSREM16214

Volume:

6 |

9 |

Sep 2022

Pages:

Publication Frequency:

Monthly (12 issues per year)

DOI
Digital Object Identifier
10.55041/IJSREM16214

License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.

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Authors

DS

Deepti Sagar

ETS

Er. Thakurendra Singh

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Abstract

The study examined the different a number of power-saving strategies, including sleep, stack, sleep stack, transmission gate logic, or self-controllable voltage level-upper (SVL-U). These methods are used with SRAM cells that have 6 transistors (6T), 7 transistors (8T), 8 transistors (9T), and 10 transistors (10T). The SVL-U method and transmission gate logic are used in suggested SRAM cell. According to a comparison of SRAM memory array as well as cells, dynamic power is significantly decreased on average when compared to traditional methods. The 45nm and 90nm software applications from Cadence are also used for simulation. According to a thorough analysis of SRAM memory arrays and cells, PDP and EDP have, on average, been significantly decreased when contrasted the state-of-the-art hybrid VLSI techniques. Therefore, these SRAMs are suitable for extremely low power embedded structural appliances.

KEYWORDS

Semiconductor Memories Memory organization SRAM Write operation Read Operation.

Cite This Article

Deepti Sagar, Er. Thakurendra Singh, "PARAMETER ANALYSIS OF SRAM CIRCUIT," International Journal of Scientific Research in Engineering and Management, vol. 6, no. 9, Sep 2022. https://doi.org/10.55041/IJSREM16214

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5/8/2022

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Review Rounds: 2

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