Crossref DOIMemberCiteFactoropen accessissn
SJIF Impact Factor 8.659 | ISSN: 2582-3930
IJSREM Logo

International Journal of Scientific Research in Engineering and Management

(Gateway to Global Scholars - An International, Scholarly, Multi-Disciplinary, Open Access Journal)

Peer-Reviewed Journal Designed to Meet UGC's Quality Parameters

HomeCurrent IssuePast IssuesPay OnlineConferencesEditorial BoardAbout UsContact Us
IJSREM

Loading article...

Follow Us

  • Google Scholar
  • ResearchGate
  • Academia.edu
  • Mendeley
  • LinkedIn
  • Facebook
  • Instagram

Journal Policies

  • Peer Review Policy
  • Publication Ethics
  • Copyright Infringement
  • Refund & Cancellation Policy
  • Terms and Conditions
  • Privacy Policy

Journal Identifiers & Licenses

  • ISSN Verified: 2582-3930ISSN Verified: 2582-3930
  • Crossref DOI: 10.55041Crossref DOI: 10.55041
  • SJIF Ranking: 08.659SJIF Ranking: 08.659
  • Licensed under CC BY 4.0Licensed under CC BY 4.0
  • ISO Certification: 9001:2015ISO Certification: 9001:2015
  • Indexed & Cited In: Google ScholarIndexed & Cited In: Google Scholar

Contact Us

International Journal of Scientific Research in Engineering and Management (IJSREM)

#62/1, New No 7, 1st Cross, 2nd Main, Ganganagar, R T Nagar, Bangalore North, Bangalore, Karnataka, India – 560032
[email protected]+91 93911 67991
logos
logos
Working Hours

Mon – Sat: 9:00 AM – 6:00 PM

Sunday: 10:00 AM – 4:00 PM

+91 93911 67991

© 2026 IJSREM – International Journal of Scientific Research in Engineering and Management. This is an open-access journal. Articles are published under the Creative Commons Attribution (CC BY 4.0) License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

DisclaimerPrivacy PolicyTerms and Conditions
ArticlePeer ReviewedOpen AccessPlagiarism Passed
Paper ID:IJSREM63486

QUANTUM ENHANCED AI SYSTEM FOR PREDICTIVE OPTIMIZATION IN SEMICONDUCTOR FABRICATION

Stream/Area:

-

Subject:

-

Paper ID:

IJSREM63486

Volume:

10 |

5 |

May 2026

Pages:

1-6

Publication Frequency:

Monthly (12 issues per year)

DOI
Digital Object Identifier
10.55041/IJSREM63486

License:International Journal of Scientific Research in Engineering and Management follows the Creative Commons Attribution 4.0 (CC BY 4.0) License, allowing free use and distribution with proper attribution.

Share this article:

Authors

YASHWANTH S H

YASHWANTH S H

ELECTRONICS AND COMMUNICATION ENGINEEERING

SRI SIDDARTHA INSTITUTE OF TECHNOLOGY

Download Author Certificate
VIKAS GOWDA S

VIKAS GOWDA S

ELECTRONICS AND COMMUNICATION ENGINEEERING

SRI SIDDARTHA INSTITUTE OF TECHNOLOGY

Download Co-Author Certificate
SANJANA B S

SANJANA B S

ELECTRONICS AND COMMUNICATION ENGINEEERING

SRI SIDDARTHA INSTITUTE OF TECHNOLOGY

Download Co-Author Certificate
VARSHA C N

VARSHA C N

ELECTRONICS AND COMMUNICATION ENGINEEERING

SRI SIDDARTHA INSTITUTE OF TECHNOLOGY

Download Co-Author Certificate

Mentors

Mr.PRAVEEN M

Mr.PRAVEEN M

ELECTRONICS AND COMMUNICATION ENGINEEERING

SRI SIDDARTHA INSTITUTE OF TECHNOLOGY

Download Mentor Certificate

Author Services & Downloads

Full ArticlesAcceptance Certificate

Abstract

This project presents a Quantum Enhanced AI System for Predictive Optimization in Semiconductor Fabrication that uses Artificial Intelligence (AI), Quantum Computing concepts, IoT sensors, and cloud-based communication to improve semiconductor manufacturing processes. Semiconductor fabrication is one of the most complex industrial processes because it involves highly sensitive operations such as wafer processing, lithography, etching, doping, deposition, and packaging. Small variations in temperature, pressure, humidity, vibration, or chemical concentration can create defects in semiconductor wafers and reduce production quality. Traditional manufacturing systems often struggle to analyze large amounts of fabrication data in real time and are unable to predict failures accurately.

KEYWORDS

Keywords—Quantum Computing Artificial Intelligence Semiconductor Fabrication Predictive Optimization IoT Sensors Cloud Monitoring Machine Learning.

Cite This Article

YASHWANTH S H, VIKAS GOWDA S, SANJANA B S, VARSHA C N, Mr.PRAVEEN M, "QUANTUM ENHANCED AI SYSTEM FOR PREDICTIVE OPTIMIZATION IN SEMICONDUCTOR FABRICATION," International Journal of Scientific Research in Engineering and Management, vol. 10, no. 5, pp. 1-6, May 2026. https://doi.org/10.55041/IJSREM63486

Full Article/Conclusion

The proposed Quantum Enhanced AI System for predictive optimization in semiconductor fabrication provides an advanced and intelligent approach for improving semiconductor manufacturing processes. By combining Artificial Intelligence models such as Transformer and Diffusion Models with Quantum Optimization techniques, the system can accurately analyze process data and defect images to predict defects and optimize production parameters. The use of bidirectional knowledge sharing between models further improves prediction accuracy and system performance. This system helps manufacturers reduce fabrication errors, improve wafer quality, increase production yield, and minimize manufacturing cost. Real-time monitoring and optimization of parameters such as temperature, pressure, and gas flow enable better process control and efficient semiconductor production. In addition, the integration of quantum computing techniques provides faster and more effective optimization compared to traditional methods.

References

[1]              IEEE – AI-Based Predictive Optimization in Semiconductor Manufacturing (2023) Michael Feldman, David Lin, and Robert Chen explained how Artificial Intelligence can improve semiconductor fabrication through defect prediction and yield optimization. Their research focuses on realtime monitoring and predictive analytics using AI models. [2]             pringer – Deep Learning Techniques for Semiconductor Defect Detection (2022) Jennifer Park and Samuel Lee discussed deep learning methods used for semiconductor wafer defect detection. Their work explains how neural networks and image processing techniques help identify manufacturing defects accurately.   [3]             Elsevier – Machine Learning and Predictive Analytics in Semiconductor Fabrication (2021) Kevin Brown, Lisa Wong, and Arun Kumar explained the use of machine learning and predictive analytics in semiconductor fabrication.  [4]             TensorFlow – TensorFlow: Large-Scale Machine Learning Framework (2024) The Google Brain Team developed TensorFlow for implementing deep learning and AI applications. The framework supports neural network training, predictive analysis, and real-time data processing.   [5]             PyTorch – PyTorch Deep Learning Framework (2024) Adam Paszke, Sam Gross, and the PyTorch Development Team created PyTorch for advanced AI and deep learning applications. The framework supports Transformer Models, Diffusion Models, and image analysis systems.   [6]             Qiskit – Qiskit: Open-Source Quantum Computing Framework (2024) The IBM Quantum Team developed Qiskit for quantum computing and optimization applications. This framework helps implement quantum algorithms for process optimization in semiconductor manufacturing. [7]              OpenCV – Learning OpenCV: Computer Vision with OpenCV Library (2020) Gary Bradski and Adrian Kaehler explained computer vision and image processing techniques using OpenCV. Their work discusses image enhancement, feature extraction, and defect detection methods. OpenCV is useful for semiconductor wafer image analysis and inspection systems.   [8]              Quantum Machine Learning for Industrial Process Optimization   (2023) Maria Gonzalez and Ethan Roberts explained how quantum computing and machine learning can work together for industrial optimization. Their research focuses on intelligent decision-making and faster computation methods.   [9]              Semiconductor Fabrication and Yield Prediction using Artificial Intelligence (2022) Rakesh Sharma and Priya Nair discussed Artificial Intelligence methods for semiconductor yield prediction and defect analysis. Their research explains how real-time process monitoring helps improve production quality.   [10]          Quantum Enhanced Optimization Techniques for Smart    Manufacturing  Systems      (2024) Daniel    White  and    Chen Liu  explained     quantum optimization methods used in smart manufacturing systems.

Editorial & Review Transparency

Publication Date

5/20/2026

Peer Review Type

Double-Blind Peer Review

Review Rounds: 2

Documents

Review Report (Confidential)
Copyright Form (Office)

Article Metrics & Impact

Article Views

1

Total views since publication

PDF Downloads

3

Total downloads since publication

Geographic Reach

5

Indexing, Archiving & Preservation

Google Scholar
Academia
ResearchGate
Crossref
SSRN
Semantic Scholar
Thomson Reuters
WorldCat
Mendeley
OpenAlex
EBSCO
Zenodo

Digital Preservation: This article is permanently archived on Zenodo and complies with all data preservation standards across major indexing platforms.

Ethics, Compliance & Transparency

Plagiarism Screening

This manuscript has been checked for plagiarism using TurnitinPlagiarismChecker software.

Conflict of Interest

The authors declare no conflict of interest related to this research work.

Funding Information

No funding information available for this research.

Similar & Recommended Articles

Similar Articles by Topic

Related research in the same subject area

Loading similar articles...